hot topics in ESD
Commercial Versus Automotive ESD Integrated Circuit Qualification
Part 2
(This article had its origin in a series of blog posts on ESD testing available at http://www.srftechnologies.com/ESD-RESOURCES.html.)
Note: This article will summarize the differences between automotive and commercial ESD testing of integrated circuits but should not be used as a substitute for a thorough reading of the actual test methods.
- A low parasitic tester is being used
- If a failure using Table 2B is deemed to be a false failure
- If the use of Table 2B leads to failures from wear out due to cumulative stress
- Connectivity must be verified for each stress
- Non-supply to non-supply stress may be done using Table 2A
- All adjacent non-supply pins must be stressed versus each other
- The options in JS-001 Section 6.6 for low parasitic HBM testers may be used.
There are also some slight differences in the classification levels between JS-002 and Q100-11. To account for the 750 V corner pin requirement, AEC has inserted an extra level into their classification scheme, creating some confusion. The new Q100‑11 level of C2 has the same definition as the JS-002 definition as JS-002 level C2a. To obtain the C2a level in Q100-11 requires corner pins passing 750 V or higher.
- ANSI/ESDA/JEDEC JS-001-2017, “For Electrostatic Discharge Sensitivity Testing, Human Body Model (HBM) – Component Level,” EOS/ESD Association, https://www.esda.org and JEDEC Solid State Technology Association, https://www.jedec.org.
- AEC–Q100-002 REV-E, “Human Body Model Electrostatic Discharge Test,” Automotive Electronics Council, http://www.aecouncil.com.
- ANSI/ESDA/JEDEC JS-002-2018, “For Electrostatic Discharge Sensitivity Testing, Charged Device Model (CDM) – Device Level,” EOS/ESD Association, https://www.esda.org, and JEDEC Solid State Technology Association, https://www.jedec.org.
- AEC-Q100-011 Rev-D, “Charged Device Model (CDM) Electrostatic Discharge (ESD) Test,” Automotive Electronics Council, http://www.aecouncil.com.